Sapphire Wafers for Bragg Reflections in XRD

university wafer substrates

 

Diameter: 200 mm (8 inches)

  • Thickness: 725 ± 25 µm
  • Type: N-type
  • Resistivity: 1-10 ohm-cm
  • Orientation: <110>
  • Surface Finish: Single side polished
  • Application: Used in sensor and actuator development, particularly in applications requiring high sensitivity and stability, benefiting from the specific orientation.

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